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28 Sep
A one-day seminar concerning advanced measurement skills organized jointly by NTC and LeCroy was hold in UPVLC last week on 24th September in Valencia Nanophotonics Technology Center premises.
Several researchers and Ph.D. students attended the seminar that covered several aspects in sampling scopes and real-time oscilloscopes and a brief guide to jitter measurements. The main differences between sampling and real-time oscilloscopes were depicted and observed in live demos with a WaveExpert sampling oscilloscope and a DDA 8 Zi real-time oscilloscope.
The sampling scope permits a highly accurate jitter analysis. The low jitter noise floor of the HCIS timebase along with LeCroy’s innovative Q-Scale jitter analysis provides over 3 times the accuracy over conventional sampling scope methods for all jitter types. On the other hand, real-time oscilloscopes include communications testing as 10/100/1000Base-T, USB and SATA compliance, CAN bus testing and decoding, and serial data communication testing including HDMI, USB, SATA, WiMedia UWB and WiMAX standards.
The content gave the attendees a comprehensive snapshot of many different key theory concepts associated with the best measurement practice leveraging on the latest innovative and affordable test equipments technology.
Information presented in the seminar:
- Time Domain Reflectometry (TDR) and S-parameters. [PDF]
- Jitter and Jitter Breakdown Analysis. [PDF]
- Advanced Analysis for High Speed Serial Data Stream. [PDF]
- From DC up to 30 GHz “Real-Time” oscilloscope Acquisition. [PDF]
- “Sampling” and “Real-Time” Oscilloscopes. [PDF]
